Failure Analysis

Equipment Supplier Model
Coating System Denton DV-401
Ersascope Inspection System Ersa 3000
Fluorenscence Stereomicroscope Leica MZFL III
Fourier Transform Infrared Spectrophotometer Perkin Elmer Spectrum One
Fourier Transform Infrared Spectrophotometer with AutoIMAGE System Perkin Elmer Spectrum GX II
Inverted Optical Microscope Nikon Epiphot-TME
Ion Chromatography System 1 & 2 Dionex DX500
Laser Section Microscope Cyper Optics LSM-500
Micro Cross-sectioning None None
Sample Preparation System I (Grinder/Polisher) Buehler Phoenix 4000
Sample Preparation System II (Grinder/Polisher) Buehler Ecomet 3
Sample Preparation System III (Grinder/Polisher) Struers Abramin
Scanning Acoustic Microscope (SAM) Sonix HS 1000TM
Scanning Electron Microscope (SEM) with Energy Dispersive X-Ray Spectrometer (EDX) Philips XL40
X-Ray Inspection System Softex 125