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Peer-reviewed Journal Publications

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No.

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99

¡§Curing Kinetics of Anisotropic Conductive Adhesive Film¡¨, Y. C. Chan, M. A. Uddin, M. O. Alam and H. P. Chan, Journal of Electronic Materials, Vol 32, No. 3, March 2003.

100

¡§The Effect of Cooling Rate on the Growth of Cu-Sn Intermetallics in Annealed PBGA Solder Joints¡¨, S. H. Fan, Y. C. Chan and J.K.L Lai, Journal of Electronic Packaging, vol 125, Issue 1, pp.153-156, March 2003.

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101

¡§Open defects in PBGA Assembly Solder Joints¡¨, S.H. Fan Y. C. Chan and J.K.L Lai, Journal of Electronic Packaging, Vol 125, Issue 1, pp. 157-161, March 2003.

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102

¡§The Effects of Reflow Process on the Contact Resistance and Reliability of Anisotropic Conductive Film Interconnection for Flip Chip on Flex Applications¡¨, C. Y. Yin, M. O. Alam, Y. C. Chan,  C. Bailey and Hua Lu,  Journal of Microelectronics Reliability,  Vol 43, Issue 4, pp. 625-633,  April 2003. 

103

¡§Corrosion Study of Anisotropic Conductive Joints on Polyimide Flexible Circuits¡¨, C.W. Tan, Y.C. Chan and Y.W. Chiu, Materials Science & Engineering B, Vol. 98(3), pp. 255-264, April 2003.

104

¡§Research on the Contact Resistance, Reliability and Degradation Mechanisms of Anisotropically Conductive Film Interconnection for Flip-Chip-on-Flex Applications¡¨, J. H. Zhang , Y. C. Chan , Journal of Electronic Materials, Vol 32, No. 4, April 2003.

105

¡§Contact Resistance and Adhesion Performance of ACF Interconnections to Aluminum Metallization¡¨, J. H.Zhang, Y. C. Chan, M. O. Alam and S. Fu, Microelectronics Reliability, Volume 43, Issue 8, pp.1303-1310, August 2003.

106

¡§Effect of reaction time and P content on mechanical strength of the interface formed between eutectic Sn¡VAg solder and Au/electroless Ni(P)/Cu bond pad¡¨, M. O. Alam, Y. C. Chan, and K. N. Tu, Journal of Applied Physics, Volume 94, Number 6, pp. 4108-4115, September 2003.

107

¡§Plasma cleaning of the Flex substrate for Flip chip bonding with anisotropic conductive adhesive film (ACF)¡¨, M. A. Uddin, M. O. Alam, Y.C. Chan and H.P. Chan. Journal of Electronic Materials, Volume 32, Number 10, 1117-1124, October 2003.

108

¡§Effect of 0.5 wt.% Cu in Sn-3.5%Ag solder on the interfacial reaction with the Au/Ni metallization¡¨, M. O. Alam, Y. C. Chan and K. N. Tu, ACS journal, Chemistry of  Materials, Volume 15, Number 23, pp. 4340-4342, November 2003.

109

¡§Effect of 0.5 wt.% Cu addition in Sn-3.5%Ag solder on the dissolution rate of Cu metallization¡¨, M. O. Alam, Y. C. Chan and K. N. Tu, Journal of Applied Physics, Volume 94, Number 12, pp. 7904-7909, December 2003.

110

¡§Comparative Study of the Dissolution Kinetics of Electrolytic Ni and Electroless Ni-P by the molten Sn3.5Ag0.5Cu solder alloy¡¨, M. N. Islam, Y. C. Chan, A. Sharif, M. O. Alam, Microelectronics Reliability, Volume 43, Number 12, pp. 2031-2037, December 2003.

111

¡§Electrical conductive characteristics of anisotropic conductive adhesive particles¡¨, G.B. Dou, Y.C. Chan, J. Liu, Journal of Electronic Packaging 125 (4): 609-616, December 2003. 

112

¡§Effect of Bonding Force on the Conducting  Particle with Different Sizes¡¨, N.H. Yeung, Y.C. Chan & C.W. Tan, Journal of Electronic Packaging, Volume 125, Issue 4. pp. 624-629, December 2003.

113

¡§Structure Property Relationship In High Tension Ceramic Insulator Fired at High Temperature¡¨, Rashed Adnan Islam, Y.C. Chan and M.F. Islam, Journal of Materials Science and Engineering ¡VB, Solid State Materials for Advanced Technology, Volume 106, Issue 2, pp.132-140, January 2004.

114

¡§Effect of Volume in Interfacial Reaction Between Eutectic Sn-Pb solder and Cu Metallization in Microelectronic Packaging¡¨ Ahmed Sharif, Y. C. Chan and Rashed Adnan Islam, Materials Science and Engineering (B): Solid State Materials for Advanced Technology, Volume 106, Number 2, pp. 120-125, January 2004.

115

¡§Dissolution Kinetics of BGA Sn-Pb and Sn-Ag Solders with Cu Substrates During Reflow¡¨ Ahmed Sharif and Y. C. Chan, Materials Science and Engineering (B): Solid State Materials for Advanced Technology, Volume 106, Number 2, pp. 126-131, January 2004.

116

¡§A Continuous Contact Resistance Monitoring during the Temperature Ramp of Anisotropic Conductive Adhesive Film Joint¡¨, M. A. Uddin, Y.C. Chan, H.P. Chan  and  M. O. Alam, Journal of Electronic Materials, Vol. 33, Iss. 1; p. 14,  January 2004.

117

¡§Dynamic Strength of Anisotropically Conductive Film (ACF) Bonded Flip Chip on Glass (COG) and Flip Chip on Flex (COF)¡¨, Y. P. Wu, M. O. Alam, Y. C. Chan and B. Y. Wu, Microelectronics Reliability, Volume 44, Issue 2, pp. 295-302. February 2004.

118

¡§Effect of Spin Coating on the Curing Rate of Epoxy Adhesive for the Fabrication of a Polymer Optical Waveguide¡¨, M.A. Uddin, H.P. Chan, C.K. Chow, Y.C. Chan, Journal of Electronic Materials, Volume 33, Issue 3, pp. 224-228, March 2004.

119

¡§Thermal Stability Performance of Anisotropic Conductive Film at Different Bonding Temperatures¡¨, S. C. Tan, Y. C. Chan, Y. W. Chiu and C. W. Tan, Microelectronics Reliability, Volume 44, Issue 3, pp. 495-503, March 2004.

120

¡§Adhesion strength and Contact resistance of Flip Chip On Flex (FCOF) packages - Effect of Curing degree of Anisotropic Conductive Film¡¨, M. A. Uddin, M. O. Alam, Y. C. Chan and H. P. Chan, Microelectronics Reliability, Volume 44, Issue 3, pp. 505-514, March 2004.

121

¡§Bias-HAST on tape ball grid array (TBGA) test pattern¡¨, N.H. Yeung, Victor Lau, Y.C. Chan, Microelectronics Reliability, Volume 44, Issue 4pp. 595-602, April 2004.

122

¡§InnovTech - Creativity and innovation learning facility for engineering students at City University of  Hong Kong¡¨, Y.C. Chan, N.H. Yeung & C.W. Tan, International Journal of Engineering Education, Vol. 20(2), pp. 261-266, April 2004.

123

¡§Delamination Problems of UV-Cured Adhesive Bonded Optical Fiber in V-Groove for Photonic Packaging¡¨, M.A. Uddin, H.P. Chan, K.W. Lam, Y.C. Chan, P.L. Chu, K.C. Hung, T.O. Tsun, IEEE Photonics Technology Letter, Volume: 16, Issue. 4, pp. 1113-1115, April 2004.

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