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Peer-reviewed Journal Publications
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No. |
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99 |
¡§Curing Kinetics of Anisotropic Conductive Adhesive
Film¡¨, Y. C. Chan, M. A. Uddin, M. O. Alam and H.
P. Chan, Journal of Electronic Materials, Vol
32, No. 3, March 2003. |
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100 |
¡§The Effect of Cooling Rate on the Growth of Cu-Sn Intermetallics in Annealed
PBGA Solder Joints¡¨, S. H. Fan, Y. C. Chan and J.K.L Lai, Journal of
Electronic Packaging, vol 125, Issue 1, pp.153-156,
March 2003. |
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101 |
¡§Open defects in PBGA Assembly Solder Joints¡¨, S.H.
Fan Y. C. Chan and J.K.L Lai, Journal of Electronic Packaging, Vol 125, Issue 1, pp. 157-161, March 2003. |
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102 |
¡§The
Effects of
Reflow Process on the Contact Resistance and Reliability of Anisotropic
Conductive Film Interconnection for Flip Chip on Flex Applications¡¨, C. Y.
Yin, M. O. Alam, Y. C. Chan, C. Bailey and Hua
Lu, Journal of Microelectronics Reliability, Vol 43, Issue 4, pp. 625-633, April 2003. |
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103 |
¡§Corrosion Study of Anisotropic Conductive Joints on
Polyimide Flexible Circuits¡¨, C.W. Tan, Y.C. Chan and Y.W. Chiu, Materials
Science & Engineering B, Vol. 98(3), pp. 255-264, April 2003. |
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104 |
¡§Research on the Contact Resistance, Reliability and
Degradation Mechanisms of Anisotropically
Conductive Film Interconnection for Flip-Chip-on-Flex Applications¡¨, J. H. Zhang
, Y. C. Chan , Journal of Electronic Materials, Vol
32, No. 4, April 2003. |
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105 |
¡§Contact Resistance and Adhesion Performance of ACF
Interconnections to Aluminum Metallization¡¨, J. H.Zhang,
Y. C. Chan, M. O. Alam and S. Fu, Microelectronics Reliability, Volume 43,
Issue 8, pp.1303-1310, August 2003. |
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106 |
¡§Effect of reaction time and P content on mechanical
strength of the interface formed between eutectic Sn¡VAg
solder and Au/electroless Ni(P)/Cu bond pad¡¨, M. O. Alam, Y. C. Chan, and K.
N. Tu, Journal of Applied Physics, Volume 94,
Number 6, pp. 4108-4115, September 2003. |
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107 |
¡§Plasma cleaning of the Flex substrate for Flip chip
bonding with anisotropic conductive adhesive film (ACF)¡¨, M. A. Uddin, M. O. Alam, Y.C. Chan and H.P. Chan. Journal of
Electronic Materials, Volume 32, Number 10, 1117-1124, October 2003. |
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108 |
¡§Effect of 0.5 wt.% Cu in
Sn-3.5%Ag solder on the interfacial reaction with the Au/Ni metallization¡¨,
M. O. Alam, Y. C. Chan and K. N. Tu, ACS
journal, Chemistry of Materials, Volume 15, Number 23, pp. 4340-4342,
November 2003. |
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109 |
¡§Effect of 0.5 wt.% Cu addition in Sn-3.5%Ag solder
on the dissolution rate of Cu metallization¡¨, M. O. Alam, Y. C. Chan and K.
N. Tu, Journal of Applied Physics, Volume 94,
Number 12, pp. 7904-7909, December 2003. |
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110 |
¡§Comparative Study of the Dissolution Kinetics of
Electrolytic Ni and Electroless Ni-P by the molten Sn3.5Ag0.5Cu solder
alloy¡¨, M. N. Islam, Y. C. Chan, A. Sharif, M. O. Alam, Microelectronics Reliability,
Volume 43, Number 12, pp. 2031-2037, December 2003. |
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111 |
¡§Electrical conductive characteristics of
anisotropic conductive adhesive particles¡¨, G.B. Dou, Y.C. Chan, J. Liu, Journal of Electronic Packaging 125 (4): 609-616,
December 2003. |
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112 |
¡§Effect of Bonding Force on the Conducting Particle with Different Sizes¡¨, N.H. Yeung, Y.C.
Chan & C.W. Tan, Journal of Electronic Packaging, Volume 125, Issue 4.
pp. 624-629, December 2003. |
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113 |
¡§Structure Property Relationship In High Tension
Ceramic Insulator Fired at High Temperature¡¨, Rashed
Adnan Islam, Y.C. Chan and M.F. Islam, Journal
of Materials Science and Engineering ¡VB, Solid State Materials for Advanced
Technology, Volume 106, Issue 2, pp.132-140, January 2004. |
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114 |
¡§Effect of Volume in Interfacial Reaction Between
Eutectic Sn-Pb solder and Cu Metallization in
Microelectronic Packaging¡¨ Ahmed Sharif, Y. C. Chan and Rashed
Adnan Islam, Materials Science and Engineering (B):
Solid State Materials for Advanced Technology, Volume 106, Number 2, pp.
120-125, January 2004. |
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115 |
¡§Dissolution Kinetics of BGA Sn-Pb
and Sn-Ag Solders with Cu Substrates During Reflow¡¨
Ahmed Sharif and Y. C. Chan, Materials Science and Engineering (B): Solid
State Materials for Advanced Technology, Volume 106, Number 2, pp. 126-131,
January 2004. |
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116 |
¡§A Continuous Contact Resistance Monitoring during
the Temperature Ramp of Anisotropic Conductive Adhesive Film Joint¡¨, M. A. Uddin, Y.C. Chan, H.P. Chan and
M. O. Alam, Journal of Electronic Materials, Vol. 33, Iss.
1; p. 14, January 2004. |
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117 |
¡§Dynamic Strength of Anisotropically
Conductive Film (ACF) Bonded Flip Chip on Glass (COG) and Flip Chip on Flex
(COF)¡¨, Y. P. Wu, M. O. Alam, Y. C. Chan and B. Y. Wu, Microelectronics Reliability,
Volume 44, Issue 2, pp. 295-302. February 2004. |
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118 |
¡§Effect of Spin Coating on the Curing Rate of Epoxy
Adhesive for the Fabrication of a Polymer Optical Waveguide¡¨, M.A. Uddin, H.P. Chan, C.K. Chow, Y.C. Chan, Journal of Electronic
Materials, Volume 33, Issue 3, pp. 224-228, March 2004. |
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119 |
¡§Thermal Stability Performance of Anisotropic
Conductive Film at Different Bonding Temperatures¡¨, S. C. Tan, Y. C. Chan, Y.
W. Chiu and C. W. Tan, Microelectronics Reliability, Volume 44, Issue 3,
pp. 495-503, March 2004. |
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120 |
¡§Adhesion strength and Contact resistance of Flip Chip
On Flex (FCOF) packages - Effect of Curing degree of Anisotropic Conductive
Film¡¨, M. A. Uddin, M. O. Alam, Y. C. Chan
and H. P. Chan, Microelectronics Reliability, Volume 44, Issue 3, pp.
505-514, March 2004. |
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121 |
¡§Bias-HAST on tape ball grid array (TBGA) test
pattern¡¨, N.H. Yeung, Victor Lau, Y.C. Chan, Microelectronics Reliability,
Volume 44, Issue 4pp. 595-602, April 2004. |
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122 |
¡§InnovTech - Creativity
and innovation learning facility for engineering students at City University
of Hong Kong¡¨, Y.C. Chan, N.H. Yeung & C.W. Tan, International
Journal of Engineering Education, Vol. 20(2), pp. 261-266, April 2004. |
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123 |
¡§Delamination Problems of UV-Cured
Adhesive Bonded Optical Fiber in V-Groove for Photonic Packaging¡¨, M.A. Uddin, H.P. Chan, K.W. Lam, Y.C. Chan, P.L. Chu, K.C.
Hung, T.O. Tsun, IEEE Photonics Technology
Letter, Volume: 16, Issue. 4, pp. 1113-1115, April 2004. |